Field Emission Scanning Electron Microscope (FE-SEM) JEOL GmbH JSM-7800F Prime (SEM) FE REM

Basic Information

Name:	Field Emission Scanning Electron Microscope (FE-SEM)
Manufacturer:	JEOL GmbH
Model:	JSM-7800F Prime (SEM) FE REM
Facility:	Competence Materials Characterization and Testing
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Analytical field emission scanning electron microscope with ultra-high resolution

Equipment/ technical data
- Emission: thermal in-lens field emission cathode
- Acceleration voltage: 10 V to 30 kV
- Resolution: 0,7 nm for acceleration voltage up to 1 KV
- Detectors: in-lens SE and BSE, BSE-detector with high resolution, STEM
- Additional „Gentle-Beam-Super-High (GBSH)“- mode to reduce lens aberration
- Energy-dispersive an wavelength-dispersive X-ray spectroscopy (EDX and WDX) by Oxford Instruments
Methods
- Imaging and analysis of nanoscaled structure details
- Imaging and analysis of magnetic specimens with low acceleration voltage
- Imaging of thin specimens transparent to electrons in STEM-mode
- Determination of chemical composition including light elements (B,C,N,O)

Prof. Dr. Martina Zimmermann

Web:

Phone:

+49 351 83391-3573

Name	Preview	Actions
Development and evaluation of process- and application-specific testing strategies
Failure and damage analysis
High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Product accompanying quality assurance
Metallographic, electron microscopic and microanalytical characterization of the real structure of metals, ceramics and composites

Preview	Description
Source: Fraunhofer IWS	Analytical field emission scanning electron microscope with ultra-high resolution- JEOL JSM-7800F Prime

Last updated at: 5 August 2019 at 10:21:21