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High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles

Basic Information

Name:	High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Facility:	Competence Materials Characterization and Testing
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Points of Contact

Prof. Dr. Martina Zimmermann

Web:

http://www.iws.fraunhofer.de/en/business_fields/materials_characterization/service_offers.html

Phone:

+49 351 83391-3573

Associated Instruments

Name	Preview	Actions
Analytic double-beam-system Focused Ion Beam and scanning electron microscope
Field Emission Scanning Electron Microscope (FE-SEM)
Laboratory for preparation using electron microscopy
Analytic transmission electron microscope 200 kV
Metallography laboratory
Scanning Electron Microscope (SEM)

Images

Preview	Description
Source: Fraunhofer IWS	Install a sample on the field emission SEM

Last Update

Last updated at: 5 August 2019 at 11:29:36