View all instruments of this unit Glimmentladungsspektrometer (GD-OES) HORIBA Jobin Yvon GmbH GD-Profiler 2™
Basic Information
| Name: | Glimmentladungsspektrometer (GD-OES) | |
| Manufacturer: | HORIBA Jobin Yvon GmbH | |
| Model: | GD-Profiler 2™ | |
| Facility: | Materials Analysis | |
| Partner: | Fraunhofer Institute for Electron Beam and Plasma Technology (FEP) |
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Description
Measure/Resolution:
chemical depth profile; depth 1 nm to 100 µm; concentration 1 ppm to 100%
Accessory/Options:
RF sputter source; 45 Elementlinien und Monochromator
Link to Further Details
Points of Contact
Dr. Olaf Zywitzki
Web:
Phone:
+49 351 2586-180
Fax:
+49 351 258655-180
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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Brochure Glimmentladungsspektrometer HORIBA GD-Profiler 2™ (Quelle: www.horiba.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:12